Speaker
Description
Ultrafast high-energy pulsed electron beams can provide deep penetration, variable linear energy transfers, and high spatiotemporal resolution for testing microelectronics for single-event effects. However, no strong correlation has yet been demonstrated between electronic responses induced by heavy ions and electrons. Experiments done at UCLA validate the um-scale spotsize requirements for this correlation. Efforts at UCLA PEGASUS (8 MeV) are ongoing to deliver sufficient charge density to mimic heavy-ion impacts on microelectronic devices, using a combination of collimators and permanent magnet lens to deliver the required beam distribution. Uniquely, the sensitivity of some electronic parts to spotsize can also provide an effective high-resolution single-shot spotsize measurement and can be used to validate beam size and beam charge at the micron and femtocoulomb scale.
Funding Agency
DARPA ASSERT Program, Tigner Fellowship (DESC0024907)
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