17–22 May 2026
C.I.D
Europe/Zurich timezone

Current Status of the High-Repetition-Rate Electron Driven Pulsed Muon Source at the SHINE Facility

THP3607
21 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Board: Thursday baguette: BA19
Poster Presentation MC3.A21: Advanced techniques/Novel sources: Secondary Beams Poster session

Speaker

Jun Kai NG (Shanghai Jiao Tong University)

Description

Shanghai High-repetition-rate XFEL and Extreme Light (SHINE) Facility provides an 8 GeV, 1 MHz, 100 pC electron beam, offers a unique driver for an electron-driven muon source complementary to existing proton-based facilities. Simulation studies have demonstrated the potential of such a source for muon-based fundamental physics and applied research. Realization of this type of muon beamline presents challenges, including lower per-bunch yield, high background, and the need for new measurement methods. As a first step, we propose a feasibility study of a muon yield measurement at SHINE facility using a compact vacuum chamber with scintillator detectors. The measurement strategy is validated through end-to-end simulation incorporating optical photon process and realistic photodetector response, demonstrating that muon decay signal can be isolated from the mixed secondary beam.

Funding Agency

The Shanghai Pilot Program for Basic Research (Grant No. 21TQ1400221)

Paper status Resubmitted proceeding files received and assigned to an editor. Accepted by Submitter.

Author

Jun Kai NG (Shanghai Jiao Tong University)

Co-authors

JIA CHENG YAP (Shanghai Jiao Tong University) Kim Siang Khaw (Shanghai Jiao Tong University)

Presentation materials