17–22 May 2026
C.I.D
Europe/Zurich timezone

Simulation study of an Electro-Optic Bunch-Profile-Monitor (EO-BPM): Machine-Learning-based reconstruction of beam’s transverse profile

MOP6340
18 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC6.D13: Instrumentation: Artificial Intelligence Poster session

Speaker

Spencer Kelham (Northern Illinois University)

Description

We present progress on developing a physics-informed machine learning framework that reconstructs two-dimensional traverse particle distributions. In this framework, the distribution is inferred from sparse electric-field measurements obtained with a simulated electro-optic beam profile monitor consisting of eight crystals arranged around the beam. A key component of the approach is the use of physics-informed loss terms that supplement standard image-based losses and mean-squared-error training, as well as moment-matching penalties based on centroid and covariance matrix, enforcing physically plausible bunch shapes. Additionally, physics-based constraints are included to ensure that the reconstructed distributions produce boundary-field patterns consistent with electric field measurements.

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Author

Spencer Kelham (Northern Illinois University)

Co-author

Gwanghui Ha (Northern Illinois University)

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