Speaker
Haiyan Yao
(University of Science and Technology of China)
Description
The beam coupling impedance originating from the interaction between the beam and its surrounding environment may lead to beam energy loss and instabilities. Traditional impedance analysis methods based on individual component modeling neglect the electromagnetic coupling effects between adjancent components, potentially affecting the accuracy of impedance model. This study investigates several key adjacent component pairs in the HALF storage ring by comparing individual and integrated structure models, analyzing the influence of cross-talk effects on impedance characteristics.
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Author
Haiyan Yao
(University of Science and Technology of China)
Co-authors
Tianlong He
(University of Science and Technology of China)
Weiwei Li
(University of Science and Technology of China)
Xiaoyu Liu
(University of Science and Technology of China)
Xin Huang
(University of Science and Technology of China)
Zhenghe Bai
(University of Science and Technology of China)