Speaker
Description
The RUEDI (Relativistic Ultrafast Electron Diffraction & Imaging) ultrafast electron diffraction (UED) beamline aims to deliver MeV electron bunches for sub-10 fs timescale diffraction experiments. The achievable resolution of the diffraction pattern at the detector is determined by the quality and focusing of the beam at the sample, and the transport of the scattered beam to the detector. A beamline design is presented which allows for flexible illumination onto the sample and variable angular magnification. The pre-sample electron optics consists of two apertures and two single solenoid lenses followed by the post-sample optics which consists of two double solenoid lenses. Simulated results are used to demonstrate the range of capabilities of each system and show that RUEDI will be capable of producing the high-resolution diffraction patterns needed for a world-leading UED machine.
| In which format do you inted to submit your paper? | LaTeX |
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