17–22 May 2026
C.I.D
Europe/Zurich timezone

Principle and First Beam Test of Bunch Length Measurement via Rydberg Atom-Based Wireless Sensing at SXFEL

MOP6639
18 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Poster session

Speaker

Jian Chen (Shanghai Synchrotron Radiation Facility)

Description

Accurate measurement of electron bunch length is critical for the performance optimization of X-ray free-electron lasers (FELs). Conventional techniques face challenges in achieving simultaneous single-shot, non-destructive, and femtosecond-level resolution. This paper presents a novel diagnostic method based on quantum wireless sensing using Rydberg atoms. The principle utilizes the extreme sensitivity of Rydberg atoms to terahertz (THz) electric fields to detect coherent Synchrotron Radiation (CSR) from electron bunches in a magnetic chicane. Theoretical calculations modeling the CSR generation in the chicane of an FEL beamline and its interaction with a Rydberg atomic system are detailed. Furthermore, we report on the development and installation of a proof-of-principle beam test platform at the BC2 chicane of the Shanghai Soft X-ray FEL (SXFEL). The platform integrates a vacuum CSR extraction port, THz beam optics, and a portable Rydberg atom sensor. Preliminary results from beam experiments are also discussed.

In which format do you inted to submit your paper? Word

Author

Jian Chen (Shanghai Synchrotron Radiation Facility)

Co-authors

Jun Wang (Shanghai Advanced Research Institute) Kaiqing Zhang (Shanghai Synchrotron Radiation Facility) Lianfa Hua (Shanghai Advanced Research Institute)

Presentation materials

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