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This work presents a comprehensive simulation study aimed at validating key optical models for X‑ray pinhole cameras and Fresnel zone‑plate (FZP) imaging lines designed for the Hefei Advanced Light Faclilty (HALF). Accurate transverse beam diagnostics are essential for beamline performance, and simplified approximations—such as the square‑aperture pinhole model, Gaussian point‑spread function (PSF), and analytical diffraction models—require rigorous evaluation under realistic conditions.
We perform systematic simulations of a HALF‑configured pinhole camera using both an ideal square aperture (25×25 µm) and a realistic two‑plate tungsten pinhole. Diffraction effects are compared between Fresnel (near‑field) and Fraunhofer (far‑field) regimes by varying source‑to‑pinhole and pinhole‑to‑detector distances. In parallel, a detailed wave‑optical simulation of a Fresnel zone‑plate imaging line is conducted to assess focusing efficiency, spatial resolution, and coherence effects under HALF beam parameters.
This integrated simulation approach supports the optimization of beam‑diagnostic instruments and coherent imaging systems at HALF, ensuring reliable performance from preliminary design to commissioning.
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