17–22 May 2026
C.I.D
Europe/Zurich timezone

Simulation of Compton-electron-induced desorption in FCC-ee using a high-energy electron beam from the PHIL facility

MOP7090
18 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC7.T14: Vacuum Technology Poster session

Speaker

SUHEYLA BILGEN (Centre National de la Recherche Scientifique)

Description

A clear understanding of dynamic pressure evolution during accelerator operation is essential for developing effective strategies to mitigate pressure rises caused by the various phenomena occurring inside vacuum chambers—effects that can ultimately lead to beam instabilities. This knowledge is particularly critical for achieving the demanding performance goals of future machines such as the HL-LHC and FCC-ee. In FCC-ee, the interaction of synchrotron radiation with the beamline walls will generate high-energy Compton electrons (up to a few MeV), which are expected to induce significant electron-stimulated desorption (ESD). However, very few data are currently available in the literature regarding electron-induced desorption in this energy range. To address this gap, a new experimental setup dedicated to measuring ESD has been developed. The system, installed on the PHIL* photo-injector beamline at IJCLab (Orsay, France), is designed to quantify the release of molecules from solid surfaces under electron impact. It consists of an experimental chamber operating in the low 10-10 mbar range (N2 eq.) and a pumping system, with continuous monitoring of both total and partial pressures. A second chamber is used for electron beam characterization (size and intensity). After qualification and commissioning of the setup, ESD experiments were conducted using an electron beam on a copper beam screen at room temperature, for various primary electron energies in the MeV range.

Footnotes

*Malyšev, O. B. (2020). Vacuum in particle accelerators: Modelling, design and operation of beam vacuum systems. Wiley-VCH Verlag GmbH & Co.
** M Alves & Co. (2013). Journal of Instrumentation, Volume 8: PHIL photoinjector test line. DOI 10.1088/1748-0221/8/01/T01001

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Author

SUHEYLA BILGEN (Centre National de la Recherche Scientifique)

Co-authors

Bruno Mercier (Centre National de la Recherche Scientifique) Gaël Sattonnay (Université Paris-Saclay, CNRS/IN2P3, IJCLab)

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