17–22 May 2026
C.I.D
Europe/Zurich timezone

Diagnosing the longitudinal phase space of an electron beam using a flat dechirper

MOP6656
18 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Board: Monday wine: WC17
Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Poster session

Speaker

MyungHoon Cho (Pohang Accelerator Laboratory)

Description

Diagnosing the longitudinal phase space of electron beams is crucial for characterizing and optimizing FEL performance in X-ray Free Electron Laser (XFEL). Because of GeV level energy and tens of femtosecond duration, diagnosing methods are limited, and the X-band Transverse Deflection Cavity (XTCAV) became a conventional equipment, which employs short RF waves (X-band) to transversely deflect electron beams. However, operation of XTCAV is complex with careful treatment to reduce RF and electron beam jitter, and moreover installation cost is expensive. Other approach to the diagnostics is a kind of passive streaking method implying a corrugated plate, which induces self-generated wakefields resulting in transverse deflection. In this presentation, we introduce a new analyzing method to diagnosing the longitudinal phase space of a corrugated flat dechirper. We demonstrate that the nonlinear correlation issue, a key limitation in conventional dechirper diagnostics, can be numerically addressed by applying the Tikhonov regularization method. The effectiveness of this approach is validated through well-defined simulations. We also show experimental results performed in the PAL-XFEL soft-xray beamline with expectation of FEL power profile.

Paper status No proceeding file submitted.

Author

MyungHoon Cho (Pohang Accelerator Laboratory)

Co-authors

Chang-Kyu Sung (Pohang Accelerator Laboratory) Chi Hyun Shim (Pohang Accelerator Laboratory) Haeryong Yang (Pohang Accelerator Laboratory) Dr Hoon Heo (Pohang Accelerator Laboratory) Kookjin Moon (Pohang Accelerator Laboratory)

Presentation materials

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