Speaker
Description
We present a combined theoretical and experimental study of Silicon Carbide–based sensors for X-ray white-beam monitoring and diagnostics in synchrotron facilities. Two complementary sensor architectures have been analysed: hole-type sensors, offering mature operation and high spatial sensitivity, and blade-type sensors, providing enhanced robustness under large beam missteers and suited as upstream “first-element” X-ray diagnostics before front-end diaphragms. Each architecture shows distinct advantages and limitations, meeting different monitoring requirements along the beamline.
These sensors, produced and commercialized by SenSiC GmbH, were tested across several international facilities, including Diamond Light Source, the Swiss Light Source (SLS 2.0), SOLEIL, and HEPS, demonstrating stable operation, accurate position sensitivity, and reliability under high thermal and photon-flux loads. Theoretical modeling, supported by detailed spectral and power-absorption simulations, shows excellent agreement with experimental results.
The long-term objective of this work is to establish a unified class of reliable SiC-based diagnostics that can act as a bridge between the accelerator and beamline communities, providing synchronized upstream (electron-beam) and downstream (X-ray beam) information to enhance beam stability, optimization, and control across the full "photon-production chain".
| Paper status | No proceeding file submitted. |
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