17–22 May 2026
C.I.D
Europe/Zurich timezone

Development of a Bunch-by-Bunch BPM Measurement System at SSRF Based on Machine Learning

MOP6641
18 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Poster session

Speaker

Jialan Pan (Shanghai Institute of Applied Physics)

Description

Real-time bunch-by-bunch monitoring of transverse position and longitudinal phase has become increasingly important for the stable operation of storage ring light sources and for accelerator physics studies. This paper presents a real-time three-dimensional bunch-by-bunch position measurement system based on machine learning. The system eliminates the need for sampling delay adjustment and avoids complex front-end circuitry by directly digitizing BPM electrode signals with high-speed ADCs at a sampling rate of five times the storage ring RF frequency. By deploying neural network models within the FPGA, the system simultaneously achieves real-time measurement of the transverse position and longitudinal phase with low latency. Beam experiments were conducted at Shanghai Synchrotron Radiation Facility (SSRF) to validate the system’s phase measurement capability. The results demonstrate a bunch-by-bunch phase resolution of 0.4ps while maintaining a measurement latency within 1µs.

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Authors

Jialan Pan (Shanghai Institute of Applied Physics) Longwei Lai (Shanghai Advanced Research Institute) Yimei Zhou (Shanghai Advanced Research Institute) Yingbing Yan (Shanghai Synchrotron Radiation Facility) Mr chenglin wang (Shanghai Institute of Applied Physics, Chinese Academy of Sciences) Yuxin Han (Shanghai Institute of Applied Physics)

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