17–22 May 2026
C.I.D
Europe/Zurich timezone

Application of novel RF direct sampling electronics for SHINE cavity BPM

MOV6601
18 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Invited poster MC6.T03: Beam Diagnostics and Instrumentation Poster session

Speaker

Yuxin Han (Shanghai Institute of Applied Physics)

Description

Shanghai High Repetition Rate XFEL and Extreme Light Facility (SHINE) is a continuous wave superconducting linear accelerator. It is the largest Chinese investment in scientific infrastructure ever. In order to achieve measurement of the electron beam position with a resolution of over 200 nm in the undulator, a new RF direct sampling electronics for the SHINE cavity BPM system was developed, which directly samples the 5.254 GHz cavity BPM signal at 2.6 GSPS with a processing speed of 1 MHz. Compared to traditional electronics, which rely on complex analog down-conversion before digitization, this system greatly simplifies the front-end by removing the need for down-conversion phases and achieving comparable performance. This is the first time that a batch of RF direct sampling electronics for cavity BPMs on a FEL has been introduced. In this paper, we will present the developed and deployment of the RF direct sampling electronics for SHINE cavity BPM.

In which format do you inted to submit your paper? Word

Author

Yuxin Han (Shanghai Institute of Applied Physics)

Co-authors

Longwei Lai (Shanghai Advanced Research Institute) Yimei Zhou (Shanghai Advanced Research Institute) Jialan Pan (Shanghai Institute of Applied Physics)

Presentation materials

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