Speaker
Description
The precise measurement of electron beam profiles is important for accelerator diagnostics. Laser wire scan is a classical and practicable method for beam size measurement which is based on Laser Compton scattering. Conventional laser wire scan methods require two separate scans: one for the horizontal and one for the vertical size. However, the slant-scattering geometry of Shanghai Laser Electron Gamma Source (SLEGS) beamline station enables the simultaneous projection of both dimensions onto a gamma-ray intensity profile, allowing both sizes to be extracted from a single scan. To enable this extraction, we developed a novel analysis approach. This approach involves numerical integral modeling of the slant-scattering process with a genetic algorithm to optimize the beam parameters. Using this method, we successfully measured the transverse electron beam size at the interaction point in the slant-scattering mode of SLEGS.
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