17–22 May 2026
C.I.D
Europe/Zurich timezone

Universal Representation of Chromatic Aberration in Electron Beam Optics

THV5602
21 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Invited poster MC5.D01: Beam Optics Lattices, Correction Schemes, Transport Poster session

Speaker

Hitoshi Tanaka (RIKEN SPring-8 Center)

Description

We present a novel unified approach to the expression and correction of electron beam chromatic aberrations, which comprehensively covers optical systems of both a single-pass beam transport line and a circular accelerator satisfying periodic boundary conditions. In an electron circular accelerator, linear chromaticity has been utilized to express the first-order difference in beam focusing caused by the electron energy deviation, which can be computed by a well-known formula using a beam envelope function (Twiss parameters). However, this conventional formulation is incompatible with non-periodic beam transport lines, such as XFELs driven by linacs and the final focus system of linear colliders. We address this discrepancy by deriving a generalized formula that seamlessly connects the two different accelerator topologies. Our representation not only reproduces the well-known ring chromaticity but also provides a consistent and practical definition of chromatic aberrations for a single-pass transport line and their correction methods. This presentation outlines one approach to resolving this apparent contradiction and the universal formula to express chromatic effects.

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Author

Kouichi Soutome (RIKEN SPring-8 Center)

Co-authors

Eito Iwai (Japan Synchrotron Radiation Research Institute) Hirokazu Maesaka (RIKEN SPring-8 Center) Hitoshi Tanaka (RIKEN SPring-8 Center) Kenji Yasutome (RIKEN SPring-8 Center) Toru Hara (RIKEN SPring-8 Center) Toshihiko Hiraiwa (RIKEN SPring-8 Center)

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