Speaker
Description
Compact electron sources with cutting-edge beam quality are unlocking higher-fidelity experiments, both directly with electrons and indirectly via bright, compact X-ray generation. A prime example is ultrafast electron diffraction (UED), which relies on sub-picosecond, low-emittance bunches in the keV–MeV range to probe structural dynamics. Similar beam requirements underpin inverse Compton scattering (ICS) X-ray sources, a laboratory-scale alternative to large synchrotron facilities.
Here we survey and advance the state of the art in the 2–30 MeV regime, emphasizing sub-100 fs electron bunches with sufficient charge for single-shot UED, ICS, and as injectors for compact FELs (e.g., MariX, CompactLight, and the ultracompact FEL at UCLA). Building on our recent work, we present new simulations that map feasible start-to-end parameters of bunch charge, energy, duration, emittance, and peak current—compatible with practical photoinjector and linac technologies. We benchmark these working points against current experimental performance and near-term hardware constraints. The results outline clear parameter sets for laboratory-scale UED and ICS and provide injector specifications that can seed next-generation, high-repetition-rate compact FELs.
Footnotes
Published in Ultramicroscopy Volume 268, January 2025, 114080.
https://doi.org/10.1016/j.ultramic.2024.114080
Funding Agency
AO acknowledges funding through the MSCA4Ukraine project 1232628 funded by
the European Union. VG acknowledges funding from Swedish Research Council (VR, 2022-03983).
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