Speaker
Description
Ultrafast high-energy pulsed electron beams can provide deep penetration and variable linear energy transfers for testing microelectronics for radiation-induced single-event effects. Early experiments at the UCLA PEGASUS beamline (3 MeV) with 1 ps electron bunches and a 50 $\mu$m spot size yielded charge collection transients that are compared with reference heavy ion data. Sub-micron focusing of the beam would allow for the electron bunch to better mimic ion tracks by saturating the charge collection in a small cross-sectional area while simultaneously providing high spatial resolution to allow for the targeted testing of microelectronic components. Using micron-scale collimators and strong lenses, current experiments are planned at UCLA to achieve smaller spot sizes in pursuit of stronger correlations with heavy-ion data.
| Region represented | North America |
|---|---|
| Paper preparation format | LaTeX |
