Speaker
Bingyang Yan
(Shanghai Institute of Applied Physics)
Description
Microbunching instability (MBI) has been an important issue in the design of advanced x-ray free-electron lasers. We have performed theoretical and simulation analyses of MBI for the transport in the beam switchyard system, including the effects of different initial beam parameters. In addition, a comparison is given for different beam switchyard section designs.
| Region represented | Asia |
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Primary author
Bingyang Yan
(Shanghai Institute of Applied Physics)
