19–24 May 2024
Music City Center
US/Central timezone

Calculation of focal spot of secondary X-rays generated by high-energy electron beam bombarding of heavy metal targets

MOPG79
20 May 2024, 16:00
2h
Bluegrass (MCC Exhibit Hall A)

Bluegrass

MCC Exhibit Hall A

Poster Presentation MC2.A23 Other Linac Based Photon Sources Monday Poster Session

Speaker

Boyuan Feng (Tsinghua University in Beijing)

Description

One of the main methods to generate X-rays is to bombard metal targets with electron beams. However, this process introduces uncertainty in the electron transport, which leads to uncertainty in the position and momentum of the secondary X-rays. As a result, the focal spot of the X-rays is larger than the electron beam. In this paper, we use the Monte Carlo software Geant4 to investigate the conditions for minimizing the X-ray focal spot size. We assign different weights to the X-rays according to their energy components, based on the actual application parameters, and calculate the focal spot size for three target materials: lead, copper, and tungsten, finding that when the incident electron energy is in the MeV range and the electron source radius is 1 um, the mass thickness of the target of 1.935×10e-3 g/cm^2 is the limit for achieving the smallest equivalent focal spot size.

Region represented Asia
Paper preparation format LaTeX

Primary author

Chongnan Shi (Tsinghua University in Beijing)

Co-authors

Boyuan Feng (Tsinghua University in Beijing) Hao Zha (Tsinghua University in Beijing) Hongyu Li (Tsinghua University in Beijing) Huaibi Chen (Tsinghua University in Beijing) Jiaru Shi (Tsinghua University in Beijing) Rong Zhou (Sichuan University)

Presentation materials

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