Speaker
Jianhao Tan
(Shanghai Advanced Research Institute)
Description
For the development of X-band deflecting structure at Shanghai Synchrotron Radiation Facility (SSRF), two units of X-band deflecting structures totally including six RF structures have been used on SXFEL successfully for ultra-fast beam diagnostics. The construction of another new FEL facility has started from 2018, which is named Shanghai high repetition rate XFEL and extreme light facility (SHINE). Four units of X-band deflectors will be installed on SHINE. The design and measurement of the first prototype has been finished, and the high power test will be carried out soon, in this paper, the design and measurement results will be presented.
Region represented | Asia |
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Paper preparation format | Word |
Primary author
Jianhao Tan
(Shanghai Advanced Research Institute)
Co-authors
Cheng Wang
(Shanghai Synchrotron Radiation Facility)
Chengcheng Xiao
(Shanghai Synchrotron Radiation Facility)
Wencheng Fang
(Shanghai Synchrotron Radiation Facility)
Xiaoxia Huang
(Shanghai Synchrotron Radiation Facility)