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IPAC'23 - 14th International Particle Accelerator Conference

7–12 May 2023
Venice, Italy
Europe/Zurich timezone

IPAC'23

Session

MC06.2 - Beam Instrumentation, Controls, Feedback & Operational Aspects (Contributed)

WEODB
10 May 2023, 11:30
Venice, Italy

Venice, Italy

Lungomare Marconi 1861 30126 Lido di Venezia Italy

Conveners

MC06.2 - Beam Instrumentation, Controls, Feedback & Operational Aspects (Contributed)

  • Gianluigi Arduini (European Organization for Nuclear Research)

Presentation materials

There are no materials yet.

  1. 1722. An upgraded universal frequency divider module for the new FLASH2020+ RF reference generation system (WEODB1)
    Mr Maciej Urbanski (Warsaw University of Technology)
    10/05/2023, 11:30
    MC6.T24: Timing and Synchronization
    Contributed Oral Presentation

    FLASH (Free Electron Laser in Hamburg) is the first FEL in the world to deliver ultrashort radiation pulses in extreme ultraviolet and soft X-ray ranges, currently being upgraded at DESY within the FLASH2020+ plan. The upgrade covers implementing new tunable undulators, improving the beam energy to 1.35 GeV, and a complete redesign of the FLASH RF Reference Generation System. That system...

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  2. 1124. 5D phase-space reconstruction of an electron beam (WEODB2)
    Sonja Jaster-Merz (Deutsches Elektronen-Synchrotron)
    10/05/2023, 11:50
    MC6.T03: Beam Diagnostics and Instrumentation
    Contributed Oral Presentation

    The complete knowledge of electron bunch properties is of great interest to understand and optimize the performance of accelerators and their applications. A new tomographic beam diagnostics method to reconstruct the full 5-dimensional phase space (x, x', y, y', t) of bunches has recently been proposed. This method combines a quadrupole-based transverse phase-space tomography with the variable...

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  3. 2598. Understanding the beam quality requirement for high energy electron microscopy (WEODB3)
    Yian Wang (Tsinghua University)
    10/05/2023, 12:10
    MC6.T03: Beam Diagnostics and Instrumentation
    Contributed Oral Presentation

    Commercial electron microscopes with a few hundred keV energies are fundamental tools for understanding the micro- to nano-scale world. One of the frontiers in electron microscopy development is to push the beam energy to MeV range to achieve improved lateral resolution for thick samples. Here we show the theoretical and preliminary experimental analysis of the electron beam quality required...

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