7–12 May 2023
Venice, Italy
Europe/Zurich timezone

Phase-space reconstruction based on severe undersampling for ultrafast electron beam

THPM136
11 May 2023, 16:30
2h
Sala Mosaici 2

Sala Mosaici 2

Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Thursday Poster Session

Speaker

Kuanjun Fan (Huazhong University of Science and Technology)

Description

In an Ultrafast Electron Diffraction (UED), high-brightness ultrafast electron beams are indispensable to capture critical ultrafast events on an atomic/molecular scale. For space-charge effects (SCE) dominated electron beams, the beam emittance increases significantly during propagation. Understanding the beam emittance evolution during its passage is critical for further improving the UED performance. To diagnose the in situ emittance of the beam at several certain positions, we use a multi-slit device with a low sampling rate to eliminate the SCE influence. Due to the fabrication technology limitation, only a few slits can be made, leading to a severe undersampling rate, creating challenges in reconstructing the original beam information. This paper introduces a method to reproduce beam from severely under-sampled data.

Footnotes

State Grid Corporation of China Technology Project 5400-202199556A-0-5-ZN.
National Nature Science Foundation of China(NSFC) 12235005;
National key research and development program of China 2022YFA1602202;

I have read and accept the Privacy Policy Statement Yes

Primary author

Kuanjun Fan (Huazhong University of Science and Technology)

Co-authors

Yang Xu (Huazhong University of Science and Technology) Hong Wang (Huazhong University of Science and Technology) Jian Wang (Huazhong University of Science and Technology) Cheng-Ying Tsai (Huazhong University of Science and Technology) Zhengzheng Liu (Huazhong University of Science and Technology) Xiangjun Li (China Electric Power Research Institute)

Presentation materials

There are no materials yet.