7–12 May 2023
Venice, Italy
Europe/Zurich timezone

BAM system and machine stability at SXFEL

THPL177
11 May 2023, 16:30
2h
Sala Laguna

Sala Laguna

Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Thursday Poster Session

Speaker

Shanshan Cao (Shanghai Advanced Research Institute)

Description

Beam arrival time is one of the key fundamental parameters for free-electron laser (FEL) facilities to ensure an accurate synchronization between an electron bunch and a seeded laser. Thus a high-performance beam arrival time/flight time measurement (BAM) system is indispensable for an FEL. A cavity-based BAM system has already been established at the Shanghai Soft-X-ray FEL test facility three years ago. To further optimize the system performance, the impacts of the local oscillator, signal processing window, and temperature around the electronic devices were analyzed, and the related subsystems were upgraded and optimized accordingly. Currently, the upgraded BAM system has been applied at the Shanghai Soft-X-ray FEL user facility. This report will focus on the evaluation of the upgraded BAM system performance and the analysis of the beam instability caused by the beam energy jitter by both analytic calculation and beam test. The beam test results show the deviation of beam flight time can reach 10 fs. Besides, a linear correlation between the beam energy and beam flight time is found and the energy jitter can contribute 33 fs to 65 fs to the beam flight time RMS jitter.

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Primary author

Shanshan Cao (Shanghai Advanced Research Institute)

Co-authors

Longwei Lai (Shanghai Advanced Research Institute) Jian Chen (Shanghai Synchrotron Radiation Facility) Yongbin Leng (Shanghai Synchrotron Radiation Facility)

Presentation materials

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