7–12 May 2023
Venice, Italy
Europe/Zurich timezone

Turn-by-turn beam size measurement based on spatial interferometer

THPL178
11 May 2023, 16:30
2h
Sala Laguna

Sala Laguna

Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Thursday Poster Session

Speaker

Yimei Zhou (Shanghai Advanced Research Institute)

Description

The transverse beam size is a key parameter of electron bunches in the storage ring for beam quality evaluation. High-precision beam size measurement will offer better performance for accelerator monitoring and will be beneficial to study beam instabilities and optimizing machine operation. The interferometer system is a commonly used diagnostic tool for beam size measurement. High accuracy measurement can be achieved with low variation of beam size. It can also be used for very small size measurements by altering slit spacing. For future research on the physics and key technologies of high-brightness electron accelerators, we will build a turn-by-turn and bunch-by-bunch beam size measurement system based on the Shanghai Synchrotron Radiation Facility (SSRF) platform for related research. It will realize high-speed and high-resolution beam size measurements with the help of a multi-slit spatial interferometer and photomultiplier array (PMT). In this paper, we will introduce the construction of the overall system, discuss related problems, and give preliminary experimental results.

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Primary author

Yimei Zhou (Shanghai Advanced Research Institute)

Co-authors

Shuai Wu (Shanghai Advanced Research Institute) Fangzhou Chen (Shanghai Synchrotron Radiation Facility) Ning Zhang (Shanghai Synchrotron Radiation Facility) Yongbin Leng (Shanghai Synchrotron Radiation Facility)

Presentation materials

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