7–12 May 2023
Venice, Italy
Europe/Zurich timezone

A consecutive double-slit emittance meter for high-brightness electron source

THPL110
11 May 2023, 16:30
2h
Sala Laguna

Sala Laguna

Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Thursday Poster Session

Speaker

Renjun Yang (Institute of High Energy Physics)

Description

High-brightness photoinjector has been an indispensable electron source driving X-ray free electron lasers (FEL). To improve the performance of the next-generation FEL, a high-quality electron beam with a small emittance, e.g, 0.1 micrometers for 100 pC bunch charge, will be of vital importance. A consecutive double-slit emittance meter has been proposed to measure such a small-emittance beam accurately. Analytical evaluations have been performed based upon the beam parameters of a C-band photocathode RF gun being constructed in the China Spallation Neutron Source.

I have read and accept the Privacy Policy Statement Yes

Primary author

Renjun Yang (Institute of High Energy Physics)

Co-authors

Tao Yang (Institute of High Energy Physics) Renhong Liu (Institute of High Energy Physics) Weiling Huang (Institute of High Energy Physics) Sheng Wang (Institute of High Energy Physics) Weidong Chen (Institute of High Energy Physics) Shimin Jiang (Institute of High Energy Physics)

Presentation materials

There are no materials yet.