Speaker
John Power
(Argonne National Laboratory)
Description
To better understand the beam-RF jitter at the Argonne Wakefield Accelerator Facility, a high-resolution bunch arrival monitor (BAM) is being developed. The BAM take advantages of a commercial, electro-optic modulator (EOM) to measure the bunch timing though optical modulation. This non-descructive technique is far superior and the resolution can be as high as several femto-second. A prototype has been developed.
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Primary author
Yawei Yang
(Argonne National Laboratory)
Co-authors
Spencer Kelham
(Northern Illinois University)
Seongyeol Kim
(Argonne National Laboratory)
Wanming Liu
(Argonne National Laboratory)
John Power
(Argonne National Laboratory)
