Speaker
Yoshihisa Iwashita
(Kyoto University)
Description
A high-density temperature and X-ray mapping system has been developed.
The X-ray mapping system, which uses strips with 32 channels of X-ray sensors, is now ready for use. The current sensor chip was selected about 10 years ago for Nb cavities operating at 2K, but recent advances in SRF cavities have required detection at higher temperatures, such as 20K for Nb3Sn materials. The current sensor chip was selected about 10 years ago for Nb cavities operating at 2K, but recent advances in SRF cavities have required detection at higher temperatures, such as 20K for Nb3Sn materials. Therefore, we are searching for a new temperature sensing element. These are reported.
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Primary author
Yoshihisa Iwashita
(Kyoto University)
Co-authors
Hiromu Tongu
(Kyoto University)
Yasuhiro Fuwa
(Japan Atomic Energy Agency)
Yasutoshi Kuriyama
(Kyoto University)
