Speaker
Description
This work presents advancements in precision longitudinal beam diagnostics for Free Electron Lasers (FELs), integrating zero-bias Schottky-diode-based THz detectors and upgraded electro-optical bunch arrival-time monitors (EO-BAMs) for low-charge operation. The developed THz detector achieves ps-scale response times and 70 GHz intermediate-frequency bandwidth, enabling single-shot THz detection across kHz–MHz repetition rates. Characterized from DC to 5.56 THz$^{*}$, it can serve as a critical tool for bunch compression monitoring$^{**}$ and lays the groundwork for future development ultra-broadband THz spectrometers. Concurrently, a novel printed circuit board (PCB) pickup structure enhances EO-BAM performance, preliminary results gave a slew rate of 275.7 mV/ps $\pm$ 34.6 mV/ps for a peak-to-peak voltage of 4.16 V $\pm$ 0.31 V at 3.45 pC after de-embedding$^{***}$.
Optimized PCB materials and planar designs improve signal integrity, achieving a simulated jitter-charge product of 9 fs·pC$^{****}$. This upgrade enables reliable operation at 1 pC for XFELs and ultrafast diffraction facilities while enhancing timing resolution in standard modes. The PCB architecture enables unprecedented flexibility for future multi-functional diagnostics. These innovations address critical challenges in low-charge, high-repetition-rate FEL diagnostics, advancing real-time beam characterization and accelerator optimization.
Footnotes
R. Yadav, et al., doi:10.3390/s23073469
R. Yadav et al., doi: 10.18429/JACoW-IBIC2024-THP41
B. E. J. Scheible et al., 10.18429/JACoW-IBIC2023-TUP012
** A. Kuzmin et al., 10.18429/JACoW-IBIC2022-WEP24
Funding Agency
The work is supported by the German Federal Ministry of Education and Research (BMBF)
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