Speaker
Alexander Ody
(Argonne National Laboratory)
Description
Accurately recording an electron bunch’s longitudinal profile is an important diagnostic for wakefield accelerators employing shaped bunches to increase transformer ratios. Electro-optic sampling of terahertz radiation from the bunch is an attractive approach due to its non-destructive nature. In preparation for future characterization experiments, the Argonne Wakefield Accelerator test facility has recently installed a 1550 nm laser system, including the necessary support systems to synchronize with the photoinjector laser system at 81.25 MHz. We report here on the initial installation and synchronization demonstrations.
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Authors
Alexander Ody
(Argonne National Laboratory)
Philippe Piot
(Argonne National Laboratory)
Co-authors
Charles Whiteford
(Argonne National Laboratory)
Eric Wisniewski
(Argonne National Laboratory)
Ingrid Wilke
(Rensselaer Polytechnic Institute)
Jinhao Ruan
(Fermi National Accelerator Laboratory)
John Power
(Argonne National Laboratory)
Payam Rabiei
(Partow Technologies (United States))
Randy Thurman-Keup
(Fermi National Accelerator Laboratory)
Scott Doran
(Argonne National Laboratory)
Seyfollah Toroghi
(Partow Technologies (United States))
Spencer Kellham
(Northern Illinois University)
Victor Scarpine
(Fermi National Accelerator Laboratory)
Wanming Liu
(Argonne National Laboratory)
