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MEDSI2025 - 13th International Conference on Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation

15–19 Sept 2025
The Loop
Europe/Zurich timezone

Contacts

Session

Precision Mechanics Session

THOD
18 Sept 2025, 15:00
Science Village Hall (The Loop)

Science Village Hall

The Loop

Lund, Sweden

Conveners

Precision Mechanics Session

  • Martin Dommach (European X-Ray Free-Electron Laser)

Presentation materials

There are no materials yet.

  1. 84. A laser tracking system for sample positioning (THOD01)
    François Villar (European Synchrotron Radiation Facility)
    18/09/2025, 15:00
    Nano-positioning
    Contributed Oral Presentation

    In the frame of the LEAPS-Innov pilot project, the ESRF together with ALBA, Soleil, PTB and HZB have developed a position measuring system based on fibered laser interferometers and beam steering mirrors that track the position of the object to be measured thanks to a closed loop control system. The global objective is to measure the position of objects moving in a plane along 3 degrees of...

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  2. 220. The X-ray free-electron laser oscillator at the European XFEL: design and status (THOD02)
    Bertram Friedrich (European X-Ray Free-Electron Laser)
    18/09/2025, 15:20
    Nano-positioning
    Contributed Oral Presentation

    This contribution provides an insight into the X-ray Free Electron Laser Oscillator (XFELO), an R&D project currently under commissioning at the European XFEL. XFELO aims to be the first demonstrator of a cavity-based free electron laser, promising significantly enhanced beam properties. The layout of the optical cavity and its integration into the SASE1 undulator section present unique...

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  3. 42. Enabling high-precision nano-positioning for beamlines: the Precision Metrology Lab at Diamond Light Source (THOD03)
    Qingxin Meng (Diamond Light Source)
    18/09/2025, 15:40
    Nano-positioning
    Contributed Oral Presentation

    The Precision Metrology Laboratory (PML) at Diamond Light Source provides an ultra-stable environment and specialist instrumentation to perform micro- and nano-scale dimensional metrology to support beamline operation. The lab enclosure is actively stabilised to 10 mK RMS in temperature and 0.5 %RH RMS in humidity. Under these conditions, sub-nm displacements have been measured using...

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  4. 37. Traceable sub-nanometre interferometry to improve nanopositioning at synchrotron and XFEL beamlines (THOD04)
    Simon Alcock (Diamond Light Source)
    18/09/2025, 16:00
    Nano-positioning
    Contributed Oral Presentation

    Coupled with faster detectors, X-ray optic upgrades, new flagship beamlines, and advanced data pipelines, the new low emittance Diamond-II source will benefit a wide range of scientific communities. Smaller, brighter, X-ray beams enable sample scanning systems to progress from slow, step-based motion to rapid, freeform dynamic trajectories. Metrology feedback devices, such as interferometers...

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