Speaker
Ivars Karpics
(European X-Ray Free-Electron Laser)
Description
The Soft X-Ray Port (SXP) instrument at European X-Ray Free Electron Laser (EuXFEL) facility is designed to provide a flexible environment for time and spin-resolved X-ray photoelectron spectroscopy (TR-XPES) experiments. Two key components of the TR-XPES experimental station are the time-of-flight (ToF) momentum microscope spectrometer and the microchannel plate delay line detector (MCP-DLD detector). This contribution describes the key steps and challenges of integration of the MCP-DLD detector at the SXP instrument and in to the Karabo control system.
Authors
Ivars Karpics
(European X-Ray Free-Electron Laser)
Dr
David Doblas-Jimenez
(European X-Ray Free-Electron Laser)
Dr
Manuel Izquierdo
(European X-Ray Free-Electron Laser)
Co-authors
Astrid Muennich
(European X-Ray Free-Electron Laser)
Dr
Patrik Grychtol
(European X-Ray Free-Electron Laser)
Dr
Michael Heber
(European X-Ray Free-Electron Laser)
Mrs
Ekaterina Tikhodeeva
(European X-Ray Free-Electron Laser)
Vahagn Vardanyan
(European X-Ray Free-Electron Laser)
Monica Turcato
(European X-Ray Free-Electron Laser)
Steffen Hauf
(European X-Ray Free-Electron Laser)
