1–6 Jun 2025
Taipei International Convention Center (TICC)
Asia/Taipei timezone

Architecture reconstruction and optimization of front-end Interlock system in TPS

THPB056
5 Jun 2025, 15:30
2h
Exhibiton Hall A _Bear (TWTC)

Exhibiton Hall A _Bear

TWTC

Poster Presentation MC7.T37 Innovation Processes Thursday Poster Session

Speaker

Yuan-Ming Hsiao (National Synchrotron Radiation Research Center)

Description

The Taiwan Photon Source's (TPS) Front-End Interlock System has been upgraded to solve operational complexity and maintainability that were noticed in the early stages of operation. For increased dependability and fault-handling capabilities, one of the main enhancements is switching the logic core from an FPGA-based architecture to a fault-tolerant dual-sequential CPU architecture.
The system integrates redundant dual CPUs with shared relay monitoring and adopts a Real-Time Operating System (RTOS) to optimize signal processing. Additionally, the safety functionalities have been restructured to include fail-safe mechanisms, independent loop monitoring, and improved logic for cooling water flow and vacuum monitoring. These updates aim to reduce unnecessary emergency shutdowns and improve system reliability.
While preserving compatibility with the legacy system, this new version streamlines the design, increases diagnostic efficiency, and expedites the deployment process for future upgrades.

Region represented Asia

Author

Yuan-Ming Hsiao (National Synchrotron Radiation Research Center)

Co-authors

Chia-Mu Cheng (National Synchrotron Radiation Research Center) Yan-Hong Guo (National Synchrotron Radiation Research Center) Chin Shueh (National Synchrotron Radiation Research Center) Yu Tsun Cheng (National Synchrotron Radiation Research Center) Che-Kai Chan (National Synchrotron Radiation Research Center) Chien-Kuang Kuan (National Synchrotron Radiation Research Center) I-Ching Sheng (National Synchrotron Radiation Research Center) Chin-Chun Chang (National Synchrotron Radiation Research Center)

Presentation materials

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