Speaker
Dr
Philipp Dijkstal
(Paul Scherrer Institut)
Description
Time-resolved diagnostics with sub-femtosecond resolution are of crucial importance for ultra-fast x-ray FEL applications. Radio-frequency (RF) transverse deflector structures (TDS) are typically employed to characterize the temporal properties of the electron beams driving FELs. If located after the undulator section, the TDS can measure the FEL power profile as well. In this contribution, we present measurements with sub-femtosecond resolution from C-band and X-band RF TDS at SwissFEL. Furthermore, we give an overview of other time diagnostics under development at SwissFEL, such as photon streaking and FEL phase diagnostics.
Author
Dr
Philipp Dijkstal
(Paul Scherrer Institut)
