25–30 Aug 2024
Hilton Chicago
America/Chicago timezone

Decrease of H- ion beam emittance with increased frequency in RF discharge

TUPB094
27 Aug 2024, 16:00
2h
Boulevard (Hilton Chicago)

Boulevard

Hilton Chicago

720 South Michigan Ave Chicago, IL 60605 USA
Poster Presentation MC1.2 Electron and ion sources, guns, photo injectors, charge breeders Tuesday Poster Session

Speaker

Vadim Dudnikov (Muons, Inc)

Description

In recent years significant progress in increase intensity of H- beam in RF surface plasma sources. H- beam intensity in RF SPS of J-Parc was increased up to 145 mA.Intensity of H- in RF SPS of SNS was increased up to 110 mA, which is enough for European spallation source storage ring. Reduction of beamlet divergence in RF negative ion source for NBI is one of high-priority targets to be solved. Minimum beamlet 1/e divergence in RF H- ion sources with low RF frequency (2-4 MHz), much higher than in ion sources with DC discharge.
- min. q div(FA) ≤ 5 mrad (obtained at NIFS and QST with DC discharge)
- min. q div(RF) ≤ 12 mrad (obtained at IPP and RFX RF ion sources)
- max. q div(ITER NB) < 7 mrad.In RF H- ion sources
In H- ion sources with low RF frequency (2-4 MHz) is observed significant modulation of beam intensity at first and second harmonic. This should lead for vibration of the meniscus shape and increase angle spread. Work with higher RF frequency (13,56 MHz) should decrease intensity modulation and decrease emittance to two times. RF SPS with a frequency 13.56 MHz could be a good solution for a European spallation source with a storage ring.

Primary author

Vadim Dudnikov (Muons, Inc)

Presentation materials

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