Speaker
Dr
Mingqi Ge
(Thomas Jefferson National Accelerator Facility)
Description
The Viton gate valves installed in the CEBAF beamline have significantly degraded after long-term operation in a radiation environment, generating numerous particles that cause heavy contamination and strong field emission. As a replacement, all-metal gate valves have been proposed for installation in the CEBAF beamline. In this paper, we present thorough comparison tests between the Viton gate valves and the all-metal gate valves, including evaluations of particle levels, aging tests of the gate valves, and analysis of the particle material.
Author
Dr
Mingqi Ge
(Thomas Jefferson National Accelerator Facility)
Co-authors
Anne-Marie Valente-Feliciano
(Thomas Jefferson National Accelerator Facility)
Roger Ruber
(Thomas Jefferson National Accelerator Facility)
Rong-Li Geng
(Thomas Jefferson National Accelerator Facility)
Shreyas Balachandran
(Florida State University)
Tom Powers
(Thomas Jefferson National Accelerator Facility)