ECRIS'26 - the 27th International Workshop on ECR Ion Sources

Session

TUC: Oral session

TUC

29 Sept 2026, 14:00

Hilton San Francisco - Financial District

47. Methods to reduce the computation time and memory to calculate the plasma potential in electron cyclotron resonance ion source (TUC1)

Thomas Thuillier (Lawrence Berkeley National Laboratory)

29/09/2026, 14:00

Contributed Oral Presentation

The Debye length in an ECRIS plasma can be as low as tens of micrometers while the confining plasma chambers are tens of centimeters in extent. Resolving the Debye length when solving the Poisson equation on a mesh inside these chambers requires an extremely fine mesh density, requiring large amounts of computer memory and resulting in long solution times. Methods to reduce the mathematical...

17. Optical emission spectroscopy diagnostic for beam monitoring in ion sources (TUC2)

Alexis Ribet (Grand Accélérateur National d'Ions Lourds)

29/09/2026, 14:30

Contributed Oral Presentation

Non-interceptive online diagnostics are essential for monitoring ion sources, particularly during physics experiments. Optical emission spectroscopy, already used in other laboratories, has been deployed at GANIL. The light emitted by the plasma is captured by a CCD camera placed behind a glass window aligned with the ion source and by an optical fiber connected to an optical spectrometer...

41. X-ray Imaging and Spectroscopy Technique via Pin-Hole camera on 3rd generation ECR Ion Source Plasmas (TUC3)

Bianca Peri (Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali del Sud)

29/09/2026, 15:00

Contributed Oral Presentation

The PANDORA (Plasmas for Astrophysics, Nuclear decay Observation and Radiation for Archaeometry) project features magnetized plasmas in compact ECR traps as experimental environments for fundamental astrophysics and nuclear physics. A new algorithm for X-ray imaging in Single-Photon Counting mode was adopted, enabling space-resolved spectroscopy for magneto plasma properties investigations...

27. Simulation and Design of an Einzel Lens for Focusing an Ion Beam into an EBIT (TUC4)

Laurenz Birnbaum (Appalachian State University)

29/09/2026, 15:30

Contributed Oral Presentation

The Smithsonian Astrophysical Observatory's (SAO) Electron Beam Ion Trap (EBIT) traps highly charged ions for astrophysical spectroscopy. Elements are injected as neutral gas or singly charged ions via a Metal Vapor Vacuum Arc (MeVVA) source, then successively ionized by a dense, quasi-monoenergetic electron beam. At high beam currents, the beam's space charge draws MeVVA ions into the EBIT's...