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Description
The Smithsonian Astrophysical Observatory's (SAO) Electron Beam Ion Trap (EBIT) traps highly charged ions for astrophysical spectroscopy. Elements are injected as neutral gas or singly charged ions via a Metal Vapor Vacuum Arc (MeVVA) source, then successively ionized by a dense, quasi-monoenergetic electron beam. At high beam currents, the beam's space charge draws MeVVA ions into the EBIT's Penning-like trap. As current decreases, this focusing weakens and injection efficiency drops sharply. This work presents a three-electrode Einzel lens designed to address this limitation and increase ion extraction.
The MeVVA ion source produces a divergent, off-axis beam, focused by the downstream Einzel lens into the EBIT trap. Trajectories were simulated in SIMION using trap electrode geometries imported from the CAD model. The EBIT's superconducting magnet, also investigated, induces only slight helical motion with under 1 mm radial excursion and can thus be neglected when optimizing the lens. Two electrodes were split in half, adding steering functionality to focus the off-axis ions onto the optical axis. Assuming uniform launch angles and a monoenergetic beam, the optimized lens yields a roughly five-fold increase in ion intensity at the EBIT center versus the unassisted case. These results motivate fabricating and installing the lens as a practical beamline upgrade.
| Classification | MC7: Beam extraction and transport |
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