Speaker
Description
Wakefield structures can generate strong transverse chirps (beam tilts) and thereby enable time-resolved beam diagnostics similar to transverse deflecting rf structures, but at a much reduced cost. Electron beam current and FEL power profile measurements using rectangular corrugated structures are routinely performed at SwissFEL and other facilities. Some of the data analysis methods required to perform the nonlinear mapping of streaked transverse coordinates to time coordinates are based on an analytical wakefield model. The analytical model was benchmarked against wakefield measurements performed under variations of streaking strength and beam optics, allowing for an assessment of the model applicability in the context of beam diagnostics. Another data analysis approach relies on on the current profile being known through other diagnostics devices to deduce the mapping function, which greatly reduces the complexity. This presentation gives an overview of the wakefield studies and wakefield-based beam diagnostics performed and developed at SwissFEL.
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