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IBIC2025 - 14th International Beam Instrumentation Conference

7–11 Sept 2025
Teaching Hub 502
Europe/London timezone

Session

Transverse Profile and Emittance Monitors / Machine Parameter Measurements

WEC
10 Sept 2025, 13:00
Teaching Hub 502

Teaching Hub 502

The University of Liverpool 160 Mount Pleasant L3 5TR Liverpool

Conveners

Transverse Profile and Emittance Monitors / Machine Parameter Measurements

  • Gero Kube (Deutsches Elektronen-Synchrotron DESY)

Presentation materials

There are no materials yet.

  1. 42. Machine Learning-based beam sculpting and measurement using a multileaf collimator and emittance exchange (WECI01)
    Nathan Majernik (SLAC National Accelerator Laboratory)
    10/09/2025, 13:00
    MC08: Machine Parameter Measurements
    Invited Oral Presentation

    This paper presents a novel, rapidly reconfigurable multileaf collimator (MLC) for high-fidelity beam shaping. The MLC, compatible with ultra-high vacuum, features independently actuated leaves to tailor mask profiles. Coupled with an emittance-exchange (EEX) beamline at the Argonne Wakefield Accelerator, transverse profiles are transformed into custom longitudinal distributions, including...

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  2. 87. Experimental demonstration of a single-shot, nondestructive electron beam diagnostic based on the ionization of a low-density pulsed gas jet (WECI02)
    Paul Denham (Particle Beam Physics Lab)
    10/09/2025, 13:30
    MC04: Transverse Profile and Emittance Monitors
    Invited Oral Presentation

    7 MeV electron bunches from a radiofrequency photoinjector, carrying
    up to 100 pC of charge, traversed a localized distribution of nitrogen
    gas (N2). The interaction of the electron bunches with the N2 gas
    generated a correlated signature in the ionized particle distribution,
    which was spatially magnified using a series of electrostatic lenses and
    recorded with a microchannel-plate...

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  3. 249. Minimally Invasive Nano-Fabricated Wire Scanner for FEL Operations (WECC01)
    Francesca Addesa (Paul Scherrer Institute)
    10/09/2025, 14:00
    MC04: Transverse Profile and Emittance Monitors
    Contributed Oral Presentation

    At the Paul Scherrer Institute (PSI), a minimally invasive wire scanner with sub-micrometer spatial resolution has been developed with a twofold objective: enabling real-time monitoring of the SwissFEL (Free Electron Laser) electron beam transverse size during lasing operation while also paving the way for a new generation of customizable wire scanners. These scanners are designed to be...

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