Speaker
Description
The measurement of transverse profiles of the electron beam is key to measuring and optimizing the emittance of a linear accelerator. Also, transverse profile monitors are used in conjunction with an RF deflecting structure to measure bunch length and slice emittance. An RF deflector and a profile monitor behind the undulator can furthermore be used to reconstruct the FEL pulse profile. I will give an overview on recent advances in beam profile measurements at SwissFEL, including scintillating screens as well as wire scanners. The goal of these advances is the improvement of the resolution in both screens and wire scanners, both by improving the optics, and by improved data processing. Furthermore, we are exploring the possibility to do non-invasive wire scans with micrometer-size wires.
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