Speaker
Sasan Ahmadiannamin
(Science and Technology Facilities Council)
Description
We propose an innovative method for measuring beam profiles at the Iranian Light Source Facility (ILSF) Synchrotron, which produces 3 GeV electron bunches. In this new generation of synchrotrons, short bunches require more precise detection techniques. The X-rays generated by dipole sources provide sufficient resolution for accurate diagnostics of the beam profile. This study explores the application of both 2-slit and 4-slit interference techniques to analyze the transverse profiles of particle bunches using the generated X-rays. Simulations are carried out using OASYS, with parameters carefully optimized to enhance measurement accuracy.
| I have read and accept the Conference Policies | Yes |
|---|
Author
Zahra Rezaei
(Iranian Light Source Facility)
Co-authors
Pedram Navidpour
(Institute for Research in Fundamental Sciences)
Samira Mohammadi Alamouti
(Institute for Research in Fundamental Sciences)
Sasan Ahmadiannamin
(Science and Technology Facilities Council)
