IBIC2025 - 14th International Beam Instrumentation Conference

Direct X-Ray imaging for the new pinhole diagnostics at BESSY II

TUPCO25

9 Sept 2025, 16:00

2h

Teaching Hub 502

Poster Presentation MC04: Transverse Profile and Emittance Monitors TUP

Speaker

Marco Marongiu (Helmholtz-Zentrum Berlin für Materialien und Energie)

Description

In order to improve our transverse diagnostic tools, two new pinhole
beamlines will be designed. The pinhole arrays will be in air for easier
maintenance: this will result in a significant loss of X-Ray photons
when passing through the vacuum window. To overcome this issue, the
option to directly illuminate a CCD/CMOS camera with X-Ray radiation
without prior conversion into visible light is under study. Tests in the
existing beamline both with a conventional CMOS camera and with a
dedicated X-Ray camera are foreseen. This report describes our findings
regarding the current status regarding the use of X-Ray cameras as a
"high flux" diagnostic tool, as well as our preliminary experimental
results.