IBIC2025 - 14th International Beam Instrumentation Conference

Recent upgrades of longitudinal diagnostics at FLASH

WEPCO23

10 Sept 2025, 16:00

2h

Courtyard, Liverpool Guild of Students

Poster Presentation MC05: Longitudinal Diagnostics and Synchronization Wednesday Poster Session

Speakers

Bernd Steffen (Deutsches Elektronen-Synchrotron DESY) Jiri Kral (Deutsches Elektronen-Synchrotron DESY)

Description

In the framework of the recent FLASH2020+ upgrade program, the longitudinal electron beam diagnostics of the FLASH accelerator had been modernized and extended by additional devices, including an electro-optical bunch length detector (EOD[1]), as well as an additional bunch compression monitor (BCM [2]) and a bunch arrival-time monitor (BAM [3]) in the new direct seeding beamline FLASH1. Also, the THz intensity spectrometer (CRISP [4]) received a modernized control interface that will allow non-experts to perform bunch profile measurements.
The paper presents an overview on the current status of the longitudinal electron beam diagnostics at FLASH and the ongoing (re-)commissioning.

Footnotes

[1] B.Steffen et al, RSI, 91, 391 (2020),
[2] Ch.Gerth, N.M.Lockmann, IBIC 2021 (2021)
[3] J.Kral, this conference IBIC 2025 (2025)
[4] N.M. Lockmann et al, PRAB 23(11), 2020