Speakers
Description
In the framework of the recent FLASH2020+ upgrade program, the longitudinal electron beam diagnostics of the FLASH accelerator had been modernized and extended by additional devices, including an electro-optical bunch length detector (EOD[]), as well as an additional bunch compression monitor (BCM []) and a bunch arrival-time monitor (BAM []) in the new direct seeding beamline FLASH1. Also, the THz intensity spectrometer (CRISP [*]) received a modernized control interface that will allow non-experts to perform bunch profile measurements.
The paper presents an overview on the current status of the longitudinal electron beam diagnostics at FLASH and the ongoing (re-)commissioning.
[* ] Compact single-shot electro-optic detection system for THz pulses with femtosecond time resolution at MHz repetition rates, B. Steffen et al., RSI, 91, 391 (2020)
Footnotes
[] Bunch compression monitor based on coherent diffraction radiation at European XFEL and FLASH, Ch. Gerth and N.M. Lockmann, IBIC2021 (2021)
[] High-performance bunch arrival time monitor with fs precision at DESY, J. Kral et al., IBIC2025
[***] Noninvasive THz spectroscopy for bunch current profile reconstruction at MHz repetition rates, N.M. Lockmann et al., PRAB 23(11), 2020
| I have read and accept the Conference Policies | Yes |
|---|
