Speaker
Description
As one of the most valuable noninvasive profile monitors in proton and heavy ion facilities， 6 Ionization Profile Monitors (IPM) have been installed in two synchrotrons of High Intensity heavy ion Accelerator Facility (HIAF). Among them, 5 IPMs are equipped with the Micro Channel Plates (MCPs) 、Phosphor screen (P46) and camera acquisition. The goal is to obtain the large envelop with good spatial resolution less than 0.1 mm, and also 1 IPM is designed with an anode and electronics acquisition for fast turn-by-turn profile measurements.
We also have come up some new ideas for IPMs during HIAF IPM design, like using an optical IPM with a slit to successfully measure the emittance. And also, a compact structure of one IPM can measure both horizontal and vertical profiles have been verified practical by beam experiments. Besides, the bunch length measurement based on electrons from residual gas ionization is also promising, with a tapered high bandwidth MCP working as the current detector. In the end, a novel idea and structure seems possible that using static electric field scanning for 2D profile measurements, and also the RF deflector scanning for fast bunch length determination.
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