7–11 Sept 2025
Teaching Hub 502
Europe/London timezone

Development of Wire Scanner Profile Monitor in FETS-FFA Test Ring

9 Sept 2025, 16:00
2h
Teaching Hub 502

Teaching Hub 502

The University of Liverpool 160 Mount Pleasant L3 5TR Liverpool
Poster Presentation MC04: Transverse Profile and Emittance Monitors TUP

Speaker

Emi Yamakawa (Science and Technology Facilities Council)

Description

Wire Scanner profile Monitor (WSM) has been developed for the demonstration ring of Fixed Field Alternating gradient (FFA) accelerator, called FETS-FFA. From previous studies, Carbon Nano Tube (CNT) wire is selected for the FETS-FFA WSM, durable for the heat damage of low energy proton beams on FETS-FFA test ring (3-12 MeV). The bias voltages are required to prevent secondary electrons returning to the wire due to stray magnetic fields of FFA main magnets. The endurance tests of bias voltages on different size of CNTs were performed prior to the beam tests on the the Front-End Test-Stand (FETS) beam line. The beam tests with bias voltages and numerical simulations revealed secondary electrons from adjacent wires degraded the reading sensitivity hence profile accuracy, explaining the peak of beam profile was not proportional to the wire size in previous studies. This paper will focus on the endurance test of bias voltages on CNTs as well as beam profile measurements with bias voltages on FETS beam line. The mechanical design of automation zig to install a thin CNT wire (diameter of 10 um) on the frame head of FETS-FFA WSM will be also presented.

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Authors

Alex Pertica (Research Applications Laboratory) Andrew Chamberlain (Science and Technology Facilities Council) Emi Yamakawa (Science and Technology Facilities Council)

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