Speaker
Description
For the upgrade of the electro-optical bunch arrival-time monitors (EO-BAMs) employed at several X-ray free-electron laser (XFEL) facilities, a novel pickup structure has been proposed, and its feasibility was successfully tested at the ELBE accelerator. The design, comprising planar pickups on a printed circuit board (PCB) with an integrated combination network, delivers a significantly stronger signal compared to established pickups. Applying the upgrade to existing machines enables two key capabilities: Reliable operation at 1 pC charge levels for XFELs and ultrafast electron diffraction facilities, and enhanced arrival-time resolution for standard operational modes. Furthermore, the PCB implementation enables unprecedented flexibility in planar pickup design, facilitating multi-functional diagnostic capabilities. This work presents a compact implementation strategy for integrating high- and low-resolution channels for EO-BAMs on a single substrate through an optimized dual-functionality layout, and conceptual advancements in beam diagnostics using an PCB architecture for measuring other beam properties.
Funding Agency
This work is supported by the German Federal Ministry of Education and Research (BMBF) under Contract No. 05K22RO2.
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