7–11 Sept 2025
Teaching Hub 502
Europe/London timezone

High-Precision Profile Measurement with COTR Interference Resistance

TUPCO23
9 Sept 2025, 16:00
2h
Teaching Hub 502

Teaching Hub 502

The University of Liverpool 160 Mount Pleasant L3 5TR Liverpool
Poster Presentation MC04: Transverse Profile and Emittance Monitors TUP

Speaker

Lianfa Hua (Shanghai Advanced Research Institute)

Description

Transverse beam profile diagnostics constitute a critical component in free-electron laser (FEL) operation and optimization. As a standard diagnostic tool, optical transition radiation (OTR) has been widely adopted in FEL facilities. However, as the bunch longitudinal length below 500 fs, the OTR method becomes significantly affected by coherent effects. This paper presents a systematic approach employing fluorescent screens combined with spatial separation measurement methodology to effectively circumvent coherent optical transition radiation (COTR) interference while achieving high-precision measurements. Experimental results obtained at the SXFFL demonstrate the system's capability to resolve beam spikes smaller than 20 μm, with agreement observed in comparison with wire scanner measurements.

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Authors

Lianfa Hua (Shanghai Advanced Research Institute) Renxian Yuan (Shanghai Advanced Research Institute, Chinese Academy of Sciences) Jie Chen (Shanghai Advanced Research Institute, Chinese Academy of Sciences) Jian Dong (Shanghai Advanced Research Institute, Chinese Academy of Sciences)

Presentation materials

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