7–11 Sept 2025
Teaching Hub 502
Europe/London timezone

Bunch-by-bunch beam current and lifetime measurement with interleaved sampling at HLS

MOPMO01
8 Sept 2025, 16:00
2h
Mountford Hall, Liverpool Guild of Students

Mountford Hall, Liverpool Guild of Students

University of Liverpool
Poster Presentation MC01: Beam Charge and Current Monitors MOPMO

Description

To achieve high-precision, bunch-by-bunch beam cur-rent and lifetime measurements at the Hefei Light Source (HLS), we developed a beam diagnostics system based on interleaved sampling technology, achieving an equivalent sampling rate of 6.5 GHz. In single-bunch mode, amplitude extraction via cross-correlation with a single response function yieds a turn-by-turn current relative resolution of 0.12%. By averaging over 200 turns, the resolution is improved to 0.04% at a 23 kHz data refresh rate, enabling fast and accurate lifetime calculations. However, in multi-bunch high-current mode, large longitudinal oscillations degrade the accura-cy of amplitude extraction when using a fixed-response function. We propose an integration method to mitigate the effects of bunch length and phase oscillations on beam current measurements. The method and experi-mental results provide a practical solution for machines exhibiting large longitudinal oscillations, such as HLS.

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Author

An Wang (National Synchrotron Radiation Laboratory)

Co-authors

Jianhui Chen (Suzhou Laboratory) Xing Yang (University of Science and Technology of China) Yongbin Leng (National Synchrotron Radiation Laboratory) Youming Deng (University of Science and Technology of China)

Presentation materials

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