7–11 Sept 2025
Teaching Hub 502
Europe/London timezone

Characterization of sub-femto-second pulse duration of low-charge electron bunches using a Bunch-Compressor-Monitor at SwissFEL

THAC01
11 Sept 2025, 10:00
20m
Teaching Hub 502

Teaching Hub 502

The University of Liverpool 160 Mount Pleasant L3 5TR Liverpool
Contributed Oral Presentation MC05: Longitudinal Diagnostics and Synchronization THA

Speaker

Gian Luca Orlandi (Paul Scherrer Institute)

Description

The absolute characterization of the electron pulse duration- bunch length - in the ultra-short and low- charge (3-10 pC) operation mode of SwissFEL is relevant to a deeper understanding of the spectral structure and broad-band distribution of the resultant Free-Electron-Laser (FEL) pulse. Under this operation mode of SwissFEL, the output signals of the Bunch-Compressor-Monitor (BCM) in operation after the final magnetic chicane (ECOL) of the hard x-ray undulator line of SwissFEL (Aramis) can be suitably processed to obtain an absolute characterization of the electron bunch-length [1]. This is possible in the ECOL-BCM thanks to the simultaneous detection of the Edge-Synchrotron radiation pulse in two different and partially overlapping spectral bands by means of a pyro-detector and an optical fiber spectrometer. Experimental results on the absolute characterization of the electron bunch-length at the ultra-short and low-charge operation mode of SwissFEL will be presented together with details on the formal method applied for processing the two output signals of the ECOL-BCM [1].

Footnotes

[1] Orlandi, G.L. Absolute and non-invasive determination of the electron bunch length in a free electron laser using a bunch compressor monitor. Sci Rep 14, 6319 (2024). https://doi.org/10.1038/s41598-024-56586-1

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Author

Gian Luca Orlandi (Paul Scherrer Institute)

Co-authors

Eduard Prat (Paul Scherrer Institute) Francesca Addesa (Paul Scherrer Institute) Philipp Dijkstal (Paul Scherrer Institute) Rasmus Ischebeck (Paul Scherrer Institute) Sean Meaney (Paul Scherrer Institute) Sven Reiche (Paul Scherrer Institute) Thomas Schietinger (Paul Scherrer Institute)

Presentation materials

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