7–11 Sept 2025
Teaching Hub 502
Europe/London timezone

Model Enhanced IPM Based Emittance Measurements at the BNL Alternating Gradient Synchrotron

9 Sept 2025, 16:00
2h
Teaching Hub 502

Teaching Hub 502

The University of Liverpool 160 Mount Pleasant L3 5TR Liverpool
Poster Presentation MC04: Transverse Profile and Emittance Monitors TUP

Speaker

Christopher Hall (RadiaSoft (United States))

Description

The Alternating Gradient Synchrotron (AGS) at Brookhaven National Lab is equipped with two types of Ionization Profile Monitors (IPMs): ion-collecting and electron-collecting. Ion-collecting IPMs are susceptible to significant distortions in the measured beam size due to the space charge of the passing beam. Conversely, electron-collecting IPMs are much less affected but can only be operated periodically to preserve sensor lifespan. In this work, WarpX simulations of IPM operation are used to characterize the measured beam size as a function of circulating beam parameters and IPM operating conditions. We then study the efficacy of integrating machine learning models into the beam size prediction algorithm to generate a better emittance measurement. We consider both supervised and unsupervised approaches. The former utilizes simulations to back out the contribution of space-charge when the ions drift from their point of origin to the collection rods. The latter case uses machine learning for noise reduction to get a better fit of the beam size data.

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Author

Christopher Hall (RadiaSoft (United States))

Co-authors

G. Hoffstaetter (Cornell University) Jonathan Edelen (RadiaSoft (United States)) Kevin Brown (Brookhaven National Laboratory) Vincent Schoefer (Brookhaven National Laboratory)

Presentation materials

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