Speaker
Description
Electron beams with energies of 100 MeV and above, commonly referred to as Very High Energy Electron (VHEE) beams, offer several properties that might be of interest for radiotherapy such as deeper penetration and insensitivity to inhomogeneity. Numerous studies, both simulations and experiments, have been conducted to verify these purported beneficial properties and assess VHEE beams feasibility for clinical application. In this paper, we use the Monte Carlo method, specifically the TOPAS software, to obtain the Percentage Depth Dose (PDD) of VHEE beams with varying energy and focusing parameters. An empirical model of the PDD is fitted to simulation data to determine the peak dose depth and entrance dose, both of which are critical parameters in radiotherapy. The results presented in this paper are independent of the beamline design and can therefore be used to guide the development of new beamline specifically for focused VHEE beams.
Region represented | Asia |
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Paper preparation format | LaTeX |